| 000 | 00538nam a2200193Ia 4500 | ||
|---|---|---|---|
| 005 | 20250220125301.0 | ||
| 008 | 250220s9999||||xx |||||||||||||| ||und|| | ||
| 020 |
_a817224438X _c1225 |
||
| 040 | _aMAIN | ||
| 041 | _aEnglish | ||
| 082 |
_a621.381 _bABR |
||
| 100 | _aAbramovici, Miron., Breuer, Melvin A. and Friedman, Arthur D. | ||
| 245 | _aDigital systems testing and testable design | ||
| 260 |
_aBombay _bJaico publishing house _c1997 |
||
| 300 | _axviii,652p. | ||
| 650 | _aElectronics | ||
| 650 | _aEngineering | ||
| 942 | _cBK | ||
| 999 |
_c26485 _d26485 |
||