| 000 | 00499nam a2200205Ia 4500 | ||
|---|---|---|---|
| 005 | 20250220125256.0 | ||
| 008 | 250220s9999||||xx |||||||||||||| ||und|| | ||
| 020 | _a0124343309 | ||
| 040 | _aMAIN | ||
| 041 | _aEnglish | ||
| 082 |
_a621.3815 _bLAL |
||
| 100 | _aLala, Parag K. | ||
| 245 | _aDigital circuit testing and testability | ||
| 260 |
_aNew York _bAcademic press _c1997 |
||
| 300 | _axii,199p. | ||
| 650 | _aCircuits | ||
| 650 | _aElectronics | ||
| 650 | _aEngineering | ||
| 942 | _cBK | ||
| 999 |
_c26241 _d26241 |
||