| 000 | 00525nam a2200205Ia 4500 | ||
|---|---|---|---|
| 005 | 20250220125218.0 | ||
| 008 | 250220s9999||||xx |||||||||||||| ||und|| | ||
| 020 |
_c _ 18.50 |
||
| 040 | _aMAIN | ||
| 041 | _aEnglish | ||
| 082 |
_a621.38152 _bKAN |
||
| 100 | _aKane, Philip K. and Larrabee, Graydon | ||
| 245 | _aCharacterization of semiconductor materials | ||
| 260 |
_aLondon _bMcgraw-hill _c1970 |
||
| 300 | _axvi,351p. | ||
| 650 | _aElectronics | ||
| 650 | _aEngineering | ||
| 650 | _aSemiconductors | ||
| 942 | _cBK | ||
| 999 |
_c24475 _d24475 |
||