| 000 | 00510nam a2200205Ia 4500 | ||
|---|---|---|---|
| 005 | 20250619145230.0 | ||
| 008 | 250619s9999||||xx |||||||||||||| ||und|| | ||
| 020 |
_a0124343309 _c720 |
||
| 040 | _aMAIN | ||
| 041 | _aEnglish | ||
| 082 |
_a621.3815 _bLAL |
||
| 100 | _aLala, Parag K. | ||
| 245 | 0 | _aDigital circuit testing and testability | |
| 260 |
_aNew York _b; Academic Press _c, 1997 |
||
| 300 | _axii,199p. | ||
| 650 | _aCircuits | ||
| 650 | _aElectronics | ||
| 650 | _aEngineering | ||
| 942 | _cBK | ||
| 999 |
_c124875 _d124875 |
||