Abramovici, Miron., Breuer, Melvin A. and Friedman, Arthur D. <br/><br/>
Digital systems testing and testable design 

 - Bombay  Jaico publishing house  1997 
 - xviii,652p. 
<br/><br/><label>ISBN: </label>817224438X  1225 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronics<br/>Engineering
<br/><br/><label>Dewey Class. No.: </label>621.381  / ABR