Lala, Parag K. <br/><br/>
Digital circuit testing and testability 

 - New York  Academic press  1997 
 - xii,199p. 
<br/><br/><label>ISBN: </label>0124343309 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits<br/>Electronics<br/>Engineering
<br/><br/><label>Dewey Class. No.: </label>621.3815  / LAL