TY  - BOOK
AU  - Lala, Parag K.
TI  - Digital circuit testing and testability
SN  - 0124343309
U1  - 621.3815 
PY  - 1997///
CY  - New York
PB  - ; Academic Press
KW  - Circuits
KW  - Electronics
KW  - Engineering
ER  -