Digital circuit testing and testability

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Material type: Text

TextLanguage: English Publication details: New York Academic press 1997Description: xii,199pISBN:

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Holdings
Item type	Current library	Call number	Status	Barcode
Books	NITTTR Kolkata	621.3815 LAL (Browse shelf(Opens below))	Available	17501

Previous	No cover image available					No cover image available		Next
Previous	621.3815 KHA Handbook of circuit design	621.3815 KUR Design of foundation systems : principles and practice	621.3815 KUR Design of foundation systems principles and practices	621.3815 LAL Digital circuit testing and testability	621.3815 LEV Digital theory and experimentation using integrated circuits revised and enlarged	621.3815 LYT Industrial transistor circuits	621.3815 MAL Experiments for semiconductor circuit approximations	Next

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