Digital circuit testing and testability

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Material type: Text

TextLanguage: English Publication details: New York ; Academic Press , 1997Description: xii,199pISBN:

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Holdings
Item type	Current library	Call number	Status	Notes	Barcode
Books	NITTTR Kolkata	621.3815 LAL (Browse shelf(Opens below))	Available	1997-06-27	17501

Previous						No cover image available	No cover image available	Next
Previous	621.3815 KUR Design of foundation systems	621.3815 KUR Design of foundation systems : principles and practice	621.3815 KUR Design of foundation systems : principles and practices	621.3815 LAL Digital circuit testing and testability	621.3815 LEV Digital theory and experimentation using integrated circuits : revised and enlarged	621.3815 LYT Industrial transistor circuits	621.3815 MAL Semiconductor circuit approximations	Next

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